送交者: 旁观者凑热闹 于 2006-2-19, 15:46:11:
回答: (ZT) "汉芯一号"造假案 (2/18/06) 由 qlyus 于 2006-2-18, 22:18:46:
http://utdirect.utexas.edu/lib/utnetcat/index2.WBX?search_type=AB&search_text=chen+jin
3 Chen, Jin, 1968- / Fault modeling and test techniques for analog and mixed-signal circuits. / 1998
Full text (PDF) from UMI/Dissertation Abstracts International
http://www.lib.utexas.edu:2048/login?url=http://wwwlib.umi.com/cr/utexas/fullcit?p9905711
DISS 1998 C42055 PCL Stacks 5K